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apl. Prof. Dr. habil. Bernd Rheinländer

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Publications


Journal articles: In submission   2007   2006   2005   2004   2003   2002   2001   2000   1999   1998   1997   1996   1995  

Electronic documents are intended for internal use only.
Corrections are added for misprints where known.

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      See also Research Reports of the Physics Institutes,
Universität Leipzig, M. Grundmann (Editor)
    2005 (pdf, 22 MB), ISBN 3-934178-64-2
    2004 (pdf, 20 MB), ISBN 3-934178-46-4
    2003 (pdf, 19 MB), ISBN 3-934178-33-2
    2002 (pdf, 31 MB), ISBN 3-934178-25-1
    2001 (pdf, 16 MB), ISBN 3-934178-17-0


   

Articles in submission:

    45. Observation of Strong Coupling by Spectroscopic Ellipsometry
H. Hilmer, C. Sturm, R. Schmidt-Grund, B. Rheinländer, and M. Grundmann
Superlatt. Microstruct. , (2000) [View PDF (388 kB)]


    44. Vacuum ultraviolet dielectric function and band structure of ZnO
R. Schmidt-Grund, D. Fritsch, M. M. Schubert, B. Rheinländer, H. Schmid t, C. M. Herzinger, E. M. Kaidashev, M. Lorenz, and M. Grundmann
J. Kor. Phys. Soc. , -accepted- (2007)


    43. Valence Band Structure of ZnO and MgxZn1-xO
R. Schmidt-Grund, C. Sturm, M. Schubert, B. Rheinländer, D. Faltermeier, H. Hochmuth, A. Rahm, J. Bläsing, C. Bundesmann, J. Zúñiga-Pérez, T. Chavdarov, M. Lorenz, and M. Grundmann
Proc. MRS , (2007)


    42. Exciton-polariton formation at room temperature in a planar ZnO resonator structure
R. Schmidt-Grund, B. Rheinländer, C. Czekalla, G. Benndorf, H. Hochmuth, M. Lorenz, and M. Grundmann
Appl. Phys. B , (2007)


    41. Exciton-polaritons in ZnO microcavity resonators
R. Schmidt-Grund, C. Sturm, H. Hilmer, J. Sellmann, C. Czekalla, B. Rheinländer, J. Lenzner, H. Hochmuth, M. Lorenz, and M. Grundmann
AIP Conf. Proc. , (2000) [View PDF (669 kB)]


    40. ZnO nano-pillar resonators with coaxial Bragg reflectors
R. Schmidt-Grund, A. Hinkel, H. Hilmer, J. Zúñiga-Pérez, Ch. Sturm, B. Rheinländer, and M. Grundmann
Mater. Res. Soc. Symp. Proc. , (2000) [View PDF (605 kB)]


    39. Structural and optical properties of ZrO2 and Al2O3 thin films and Bragg reflectors grown by pulsed laser deposition
J. Sellmann, Ch. Sturm, R. Schmidt-Grund, Ch. Czekalla, J. Lenzner, H. Hochmuth, B. Rheinländer, M. Lorenz, and M. Grundmann
phys. stat. sol. (c) , -accepted- (2007)


    38. Investigation of the free charge carrier properties at the ZnO-sapphire interface in a-plane ZnO films studied by generalized infrared ellipsometry
C. Sturm, T. Chavdarov, R. Schmidt-Grund, B. Rheinländer, C. Bundesmann, H. Hochmuth, M. Lorenz, M. Schubert, and M. Grundmann
phys. stat. sol. (c) , -accepted- (2007)


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2007:

    37. Photoluminescence properties of MgxZn1-xO thin films grown by pulsed laser deposition
S. Heitsch, G. Zimmermann, D. Fritsch, C. Sturm, R. Schmidt-Grund, C. Schulz, H. Hochmuth, D. Spemann, G. Benndorf, B. Rheinländer, Th. Nobis, M. Lorenz, and M. Grundmann
J. Appl. Phys. 101, 083521 (2007) [View PDF (140 kB)]


    36. ZnO micro-pillar resonators with coaxial Bragg reflectors
R. Schmidt-Grund, B. Rheinländer, T. Gühne, H. Hochmuth, V. Gottschalch, A. Rahm, J. Lenzner, and M. Grundmann
AIP Conf. Proc. 893, 1137 (2007) [View PDF (196 kB)]


    35. ZnO based planar and micro-pillar resonators
R. Schmidt-Grund, B. Rheinländer, C. Czekalla, G. Benndorf, H. Hochmut, A. Rahm, M. Lorenz, and M. Grundmann
Superlatt. Microstruct. 41, 360 (2007) [View PDF (466 kB)]


    34. Optical Properties of Cylindrite
C. Sturm, R. Schmidt-Grund, R. Kaden, H. von Wenckstern, B. Rheinländer, K. Bente, and M. Grundmann
AIP Conf. Proc. 893, 1483 (2007)


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2006:

    33. Properties of (InGa)As/GaAs QW (\lamda~1.2µm) Facet-Coated Edge Emitting Diode Laser
T. Gühne, V. Gottschalch, G. Leibiger, H. Herrnberger, J. Kovác, J. Kovác, Jr., R. Schmidt-Grund, B. Rheinländer, and D. Pudis
Laser Physics 16, 441 (2006) [View PDF (75 kB)]


    32. Cylindric resonators with coaxial Bragg reflectors
R. Schmidt-Grund, T. Gühne, H. Hochmuth, B. Rheinländer, A. Rahm, V. Gottschalch, J. Lenzner, and M. Grundmann
SPIE Vol. 6038, 603827 (2006) [View PDF (1.7 MB)]


    31. Refractive indices and band-gap properties of rocksalt MgxZn1-xO (0.68 < x < 1)
R. Schmidt-Grund, A. Carstens, B. Rheinländer, D. Spemann, H. Hochmut, G. Zimmermann, M. Lorenz, M. Schubert, C. M. Herzinger, and M. Grundmann
J. App. Phys. 99, 123701 (2006) [View PDF (183 kB)]


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2005:

    30. Band-to-band transitions and optical properties of MgxZn1-xO (0 < x < 1) films
R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmid t, H. Hochmuth, M. Lorenz, C.M. Herzinger, and M. Grundmann
AIP Conf. Proc. 772, 201 (2005) [View PDF (45 kB)]


    29. a-Si/SiOx Bragg-reflectors on micro-structured InP
R. Schmidt-Grund, T. Nobis, V. Gottschalch, B. Rheinländer, H. Herrnberger, and M. Grundmann
Thin Solid Films 483, 257-260 (2005) [View PDF (238 kB)]


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2004:

    28. Facet coating of edge emitting 1.2 µm-wavelength (InGa)As laser diodes
T. Gühne, V. Gottschalch, G. Leibiger, H. Herrnberger, J. Kovac, J. Kovac jr., R. Schmidt-Grund, and B. Rheinländer
Proceedings of the 28th Workshop on Compound Semiconductor Devices and Integrated Circuits Europe , WOCSDICE (2004) [View PDF (1.5 MB)]


    27. UV-VUV Spectroscopic ellipsometry of ternary MgxZn1-xO (x<0.53) thin films
R. Schmidt-Grund, M. Schubert, B. Rheinländer, D. Fritsch, H. Schmid t, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, and M. Grundmann
Thin Solid Films 455-456, 500-504 (2004) [View PDF (259 kB)]


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2003:

    26. Optical properties of ternary MgZnO thin films
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Rheinländer, M. Schubert, M. Lorenz, E. M. Kaidashev, D. Spemann, T. Butz, J. Lenzner, and M. Grundmann
IoP Conf. Series 171, P11 (2003) [View PDF (291 kB)]


    25. Dielectric functions (1 to 5 eV) of wurtzite MgxZn1-xO (x<0.29) thin films
R. Schmidt, B. Rheinländer, M. Schubert, D. Spemann, T. Butz, J. Lenzner, E. M. Kaidashev, M. Lorenz, A. Rahm, H. C. Semmelhack, and M. Grundmann
Appl. Phys. Lett. 82, 2260-2262 (2003) [View PDF (75 kB)]


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2002:

    24. Plasma-enhanced chemical vapor deposition of SiOx/SiNx Bragg reflectors
V. Gottschalch, R. Schmidt, B. Rheinländer, D. Pudis, S. Hardt, J. Kvietkova, G. Wagner, and R. Franzheld
Thin Solid Films 416, 224-232 (2002) [View PDF (816 kB)]


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2001:

    23. Effective carrier mass and mobility versus carrier concentration in p- and n-type α-GaN determined by infrared ellipsometry and Hall resistivity measurements
A. Kasic, M. Schubert, B. Rheinländer, V. Riede, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz
Mat. Sci. Eng. B 82, 74 (2001) [View PDF (79 kB)]


    22. IR-VUV Dielectric Function of Al1-xInxN determined by spectroscopic ellipsometry
A. Kasic, M. Schubert, B. Rheinländer, J. Off, F. Scholz, and C. M. Herzinger
Mat. Res. Soc. Symp. 639, G6.13 (2001) [View PDF (106 kB)]


    21. Model dielectric function spectra of GaAsN for far-infrared and near-infrared to ultra violet wavelengths
G. Leibiger, V. Gottschalch, B. Rheinländer, J. Sik, and M. Schubert
J. Appl. Phys. 89, 4927-4938 (2001) [View PDF (194 kB)]


    20. Optical Constants, Critical Points, and Phonon Modes of GaAsN Single Layers
G. Leibiger, V. Gottschalch, A. Kasic, B. Rheinländer, J. Sik, and M. Schubert
Mat. Res. Soc. Symp. 639, G6.35 (2001) [View PDF (162 kB)]


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2000:

    19. Nitrogen dependence of the GaAsN interband critical points E1 and E1 + Δ1 determined by spectroscopic ellipsomety
Leibiger, G., Gottschalch, V., Rheinländer, B., Sik J., and Schubert, M.
Appl. Phys. Lett. 77, 1650-1652 (2000) [View PDF (62 kB)]


    18. Excitonic effects of InAs monolayers in GaAs/AlGaAs-microcavities
S. Nassauer, A. Kasic, B. Rheinländer, V. Gottschalch, J. Kovác, J. Kvietková , and G. Benndorf
Microelectron. Eng. 51-52, 401 (2000) [View PDF (271 kB)]


    17. ZnO nano-pillar resonators with coaxial Bragg reflectors
R. Schmidt-Grund, A. Hinkel, H. Hilmer, J. Zúñiga-Pérez, Ch. Sturm, B. Rheinländer, and M. Grundmann
Mater. Res. Soc. Symp. Proc. , (2000) [View PDF (605 kB)]


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1999:

    16. Isotropic dielectric functions of highly disordered AlxGa1-xInP (0\lexle1) lattice matched to GaAs
M. Schubert, Woollam, J. A., Leibiger, G., Rheinländer, B., Pietzonka, I., Saß, T., and Gottschalch, V.
J. Appl. Phys. 86, 2025-2033 (1999) [View PDF (146 kB)]


    15. Near-band-gap CuPt order birefringence in Al0.48Ga0.52InP2
M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Saß, V. Gottschalch, and J. A. Woollam
Phys. Rev. B 60, 16618 - 16634 (1999) [View PDF (337 kB)]


    14. Free-carrier response and lattice modes of group III-nitride heterostructures measured by infrared ellipsometry
M. Schubert, J. A. Woollam, A. Kasic, B. Rheinländer, J. Off, B. Kuhn, and F. Scholz
phys. stat. sol. (b) 216, 655 (1999) [View PDF (175 kB)]


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1997:

    13. Dielectric function effects due to isovalent monolayers of III-elements buried in GaAs, GaP and AlGaAs
H. Schmid t, B. Rheinländer, A. Kasic, and V. Gottschalch
phys. stat. sol. (a) 164, 123 (1997) [View PDF (167 kB)]


    12. Spectroscopic ellipsometric studies of InAs monolayers embedded in GaAs
B. Rheinländer, H. Schmid t, and V. Gottschalch
Appl. Phys. Lett. 70, 1736-1737 (1997)


    11. Application of generalized ellipsometry to complex optical systems
M. Schubert, B. Rheinländer, B. Johs, and J. A. Woollam
SPIE Vol. 3094, 255-265 (1997)


    10. Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry and boron nitride as an example
M. Schubert, B. Rheinländer, E. Franke, H. Neumann, T.E. Tiwald, J.A. Woollam, J. Hahn, and F. Richter
Phys. Rev. B 56, 13306-13313 (1997) [View PDF (209 kB)]


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1996:

    9. Optical properties of microconfined liquid crystals
C. Cramer, H. Binder, M. Schubert, B. Rheinländer, and H. Schmiedel
Mol. Cryst. Liq. Cryst. 282, 395-405 (1996)


    8. Direct-gap reduction and valence-band splitting of ordered indirect-gap AlInP2 studied by dark-field spectroscopy
M. Schubert, B. Rheinländer, E. Franke, I. Pietzonka, J. Skriniarova, and V. Gottschalch
Phys. Rev. B 54, 17616-17619 (1996) [View PDF (147 kB)]


    7. Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO2
Schubert, M., Rheinländer, B., Woollam, J.A., Johs B., and Herzinger,C. M.
J. Opt. Soc. Am. A 13, 875-883 (1996) [View PDF (1.3 MB)]


    6. Generalized Transmission Ellipsometry for twisted biaxial dielectric media: Application to chiral liquid crystals
M. Schubert, B. Rheinländer, C. Cramer, H. Schmiedel, B. Johs, C. M. Herzinger, and J.A.Woollam
J. Opt. Soc. Am. A 13, 1930-1940 (1996) [View PDF (1.6 MB)]


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1995:

    5. Dark-field-spectroscopy on spontaneously ordered GaInP2
B. Rheinländer, M. Schubert, and V. Gottschalch
phys. stat. sol. (a) 152, 287-292 (1995)


    4. Band-gap reduction and valence band splitting in spontaneously ordered GaInP2 studied by Dark-field-spectroscopy
M. Schubert, B. Rheinländer, and V. Gottschalch
Solid State Commun. 95, 723-726 (1995)


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Go back to the main List Last update May 6th, 2003