Ellipsometry and Polariton Physics Group

Methods

@ University of Leipzig          |          @ IOM Leipzig

Ellipsometry @ IOM Leipzig

RC2-DI (J.A. Woollam Co., Inc)

Spectroscopic Mueller-matrix ellipsometer, dual-rotating-compensator-type
Parameter/Options:
      - Spectral range:
   193 nm - 1700 nm / 0.7 eV - 6.4 eV
- Standard ellipsometry
- Generalized ellipsometry
- (Full) 4x4 Mueller matrix ellipsometry
- Depolarization, reflection and transmission
- Focussing probes (spot diameter 300 µm)
- Automated angle stage
- Scanning option (rotation and translation stage)
- In-situ application 		RC2

M88 (J.A. Woollam Co., Inc)

Spectroscopic ellipsometer, rotating-analyzer-type
Parameter/Options:
      - Spectral range:
   283 nm - 760 nm / 1.6 eV - 4.4 eV
- Standard ellipsometry
- Manual angle stage
- In-situ application 		M88


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