Ellipsometry @ University of Leipzig |
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Ellipsometry
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Photoluminescence
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Other
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| M2000 Ellipsometer |
in situ ellipsometer
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spectral range:
temperature range:
methodes:
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(0.73 - 3.23) eV
(RT - 850) K
- generalized ellipsometry
- depolarization
- reflection and transmission
- focussing (200µm)
- scanning
- in-situ application (PLD process control)
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| VASE Ellipsometer |
spectroscopic ellipsometer
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spectral range:
temperature range:
methodes:
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(0.75 - 5.00) eV
(9 - 470) K
- generalized ellipsometry
- depolarization
- reflection and transmission
- focussing (200µm)
- θ-scanning
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| VUV-VASE Ellipsometer |
spectroscopic ellipsometer
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spectral range:
temperature range:
methodes:
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(0.5 - 9.0) eV
(9 - 800) K
- generalized ellipsometry
- depolarization
- reflection and transmission
- 300mm R-θ scanning
- atmospheric cell
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| IR-VASE Ellipsometer |
infrared spectroscopic ellipsometer
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spectral range:
temperature range:
methodes:
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(333 - 5000) cm1
300 K
- generalized ellipsometry
- depolarization
- reflection and transmission
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| AROSE |
angular resolved optical spectroscopy and excitation
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spectral range:
angular range:
angular resolution:
time resolution:
temperature range:
excitation laser:
methodes:
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(1.5 - 4.0) eV
(0 - ±90)°
1°
> 5 ps (streak camera)
(10 - 500) K
c.f. µ-PL
- generalized ellipsometry
- Raman spectroscopy
- polarized reflection and transmission
- polarized pump and probe experiments
- polarized photoluminescence
- angular and time resolved spectroscopy
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